Norm

NPR-IEC/PAS 62189:2001 en

Bias Life

11,63

Over deze norm

Status Definitief
Aantal pagina's 5
Commissie Halfgeleiders
Gepubliceerd op 01-02-2001
Taal Engels
Performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device Qualification and reliability monitoring.

Details

ICS-code 31.080.01
Nederlandse titel Bias Life
Engelse titel Bias Life

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