Norm

NPR-IEC/PAS 62191:2001 en

Acoustic microscopy for nonhermetic encapsulated electronic components

  • Deze norm is ingetrokken sinds 24-10-2006

20,77

Over deze norm

Status Ingetrokken
Aantal pagina's 14
Commissie Halfgeleiders
Gepubliceerd op 01-02-2001
Taal Engels
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. This method provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compound voids, etc) nondestructively in plastic packages while achieving reproducibility.

Details

ICS-code 31.080.01
Nederlandse titel Acoustic microscopy for nonhermetic encapsulated electronic components
Engelse titel Acoustic microscopy for nonhermetic encapsulated electronic components
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