Norm

NPR-IEC/PAS 62202:2001 en

Failure mechanisms and models for silicon semiconductor devices

58,16

Over deze norm

Status Definitief
Aantal pagina's 32
Commissie Halfgeleiders
Gepubliceerd op 01-02-2001
Taal Engels
Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations whens the only available data is based on tests performed at accelerated stress test conditions. The method to be used in the Sum-of-the-Failure-Rates method.

Details

ICS-code 31.080.01
Nederlandse titel Failure mechanisms and models for silicon semiconductor devices
Engelse titel Failure mechanisms and models for silicon semiconductor devices

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