Norm

NPR-IEC/PAS 62203:2001 en

Guide for the standard probe pad sizes and layouts for water-level electrical testing

11,63

Over deze norm

Status Definitief
Aantal pagina's 5
Commissie Halfgeleiders
Gepubliceerd op 01-02-2001
Taal Engels
Applies to double- and single-column arrays of metal probe pads, on a semiconductor wafer or chip, that are electrically connected to one or more test structures.

Details

ICS-code 31.080.01
Nederlandse titel Guide for the standard probe pad sizes and layouts for water-level electrical testing
Engelse titel Guide for the standard probe pad sizes and layouts for water-level electrical testing

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