Norm

NPR-IEC/PAS 62205:2001 en

High temperature storage life

8,31

Over deze norm

Status Definitief
Aantal pagina's 2
Commissie Halfgeleiders
Gepubliceerd op 01-02-2001
Taal Engels
To determine the effect on solid state electronic device of storage at elevated temperature without electrical stress applied. This test is considered destructive and. therefore, is applicable for device qualification.

Details

ICS-code 31.080.01
Nederlandse titel High temperature storage life
Engelse titel High temperature storage life

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