Norm

NPR-IEC/PAS 62276:2001 en

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

  • Deze norm is ingetrokken sinds 01-11-2008

41,55

Over deze norm

Status Ingetrokken
Aantal pagina's 26
Gepubliceerd op 01-11-2001
Taal Engels
Applies to single crystal wafers, intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium telraborate crystals for surface acoustic wave (SAW) filters and resonators.

Details

ICS-code 31.140
Nederlandse titel Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
Engelse titel Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
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