Norm

NPR-IEC/TR 62866:2014 en;fr

Electrochemical migration in printed wiring boards and assemblies - Mechanisms and testing

271,71

Over deze norm

Status Definitief
Aantal pagina's 187
Commissie Halfgeleiders
Gepubliceerd op 01-05-2014
Taal Engels, Frans
NPR- IEC/TR 62866 describes the history of the degradation of printed wiring boards caused by electrochemical migration, the measurement method, observation of the failure and remarks to testing in detail.

Details

ICS-code 31.180
Engelse titel Electrochemical migration in printed wiring boards and assemblies - Mechanisms and testing

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