Over deze norm
| Status | Definitief |
| Aantal pagina's | 12 |
| Commissie | Halfgeleiders |
| Gepubliceerd op | 01-04-2019 |
| Taal | Engels |
NPR-IEC/TR 62878-2-7 describes the accelerated stress testing of passive embedded circuit boards. It can be used for screening finished boards, including multilayer and high-density interconnection (HDI) boards. These boards are mainly for mobile devices.
Details
| ICS-code |
31.180
31.190 |
| Engelse titel | Device embedding assembly technology - Part 2-7: Guidelines - Accelerated stress testing of passive embedded circuit boards |
