Norm

NPR-IEC/TR 62878-2-7:2019 en

Device embedding assembly technology - Part 2-7: Guidelines - Accelerated stress testing of passive embedded circuit boards

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Status Definitief
Aantal pagina's 12
Commissie Halfgeleiders
Gepubliceerd op 01-04-2019
Taal Engels
NPR-IEC/TR 62878-2-7 describes the accelerated stress testing of passive embedded circuit boards. It can be used for screening finished boards, including multilayer and high-density interconnection (HDI) boards. These boards are mainly for mobile devices.

Details

ICS-code 31.180
31.190
Engelse titel Device embedding assembly technology - Part 2-7: Guidelines - Accelerated stress testing of passive embedded circuit boards

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