Over deze norm
NPR-IEC/TS 62878-2-4 describes the test element group devices useful when measuring basic properties of device embedded substrates. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components. The IEC 62878 series neither applies to the re-distribution layer (RDL) nor to the electronic modules defined as an M-type business model in IEC 62421.
|Engelse titel||Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)|