Norm

NPR-ISO/TS 17915:2013 en

Optics and photonics - Measurement method of semiconductor lasers for sensing

124,99

Over deze norm

Status Definitief
Aantal pagina's 27
Commissie Intra-oculaire lenzen en contactlenzen
Gepubliceerd op 01-07-2013
Taal Engels
This Technical Specification describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. This Technical Specification is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. This Technical Specification is an application of ISO 13695, in which the physical bases are explained.

Details

ICS-code 31.260
Engelse titel Optics and photonics - Measurement method of semiconductor lasers for sensing

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